Measuring the Migdal effect in semiconductors for dark matter detection

Duncan Adams; Daniel Baxter; Hannah Day; Rouven Essig; Yonatan Kahn

doi:10.1103/PhysRevD.107.L041303

Measuring the Migdal effect in semiconductors for dark matter detection

Duncan Adams
, Daniel Baxter
, Hannah Day
, Rouven Essig
, Yonatan Kahn

Institute for Theoretical Physics

Stony Brook University
Fermi National Accelerator Laboratory
University of Illinois at Urbana-Champaign

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The Migdal effect has received much attention from the dark matter direct detection community, in particular due to its power in setting leading limits on sub-GeV particle dark matter. However, it is crucial to obtain experimental confirmation of the Migdal effect through nuclear scatterin.

Original language	English
Article number	L041303
Journal	Physical Review D
Volume	107
Issue number	4
DOIs	https://doi.org/10.1103/PhysRevD.107.L041303
State	Published - Feb 15 2023

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10.1103/PhysRevD.107.L041303

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title = "Measuring the Migdal effect in semiconductors for dark matter detection",

abstract = "The Migdal effect has received much attention from the dark matter direct detection community, in particular due to its power in setting leading limits on sub-GeV particle dark matter. However, it is crucial to obtain experimental confirmation of the Migdal effect through nuclear scatterin.",

author = "Duncan Adams and Daniel Baxter and Hannah Day and Rouven Essig and Yonatan Kahn",

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AU - Essig, Rouven

AU - Kahn, Yonatan

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AB - The Migdal effect has received much attention from the dark matter direct detection community, in particular due to its power in setting leading limits on sub-GeV particle dark matter. However, it is crucial to obtain experimental confirmation of the Migdal effect through nuclear scatterin.

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DO - 10.1103/PhysRevD.107.L041303

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JO - Physical Review D

JF - Physical Review D

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Measuring the Migdal effect in semiconductors for dark matter detection

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