Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

Emrah Celik; Erkan Oterkus; Ibrahim Guven; Erdogan Madenci

doi:10.1109/ECTC.2009.5074026

Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

Emrah Celik
, Erkan Oterkus
, Ibrahim Guven
, Erdogan Madenci

Civil Engineering

University of Arizona

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

8 Scopus citations

Abstract

In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.

Original language	English
Title of host publication	2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009
Pages	262-268
Number of pages	7
DOIs	https://doi.org/10.1109/ECTC.2009.5074026
State	Published - 2009
Event	2009 59th Electronic Components and Technology Conference, ECTC 2009 - San Diego, CA, United States Duration: May 26 2009 → May 29 2009

Publication series

Name	Proceedings - Electronic Components and Technology Conference
ISSN (Print)	0569-5503

Conference

Conference	2009 59th Electronic Components and Technology Conference, ECTC 2009
Country/Territory	United States
City	San Diego, CA
Period	05/26/09 → 05/29/09

Access to Document

10.1109/ECTC.2009.5074026

Cite this

Celik, E., Oterkus, E., Guven, I., & Madenci, E. (2009). Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. In 2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009 (pp. 262-268). Article 5074026 (Proceedings - Electronic Components and Technology Conference). https://doi.org/10.1109/ECTC.2009.5074026

@inproceedings{a8cfbd288e35461cb1c0030e31561401,

title = "Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations",

abstract = "In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.",

author = "Emrah Celik and Erkan Oterkus and Ibrahim Guven and Erdogan Madenci",

year = "2009",

doi = "10.1109/ECTC.2009.5074026",

language = "English",

isbn = "9781424444762",

series = "Proceedings - Electronic Components and Technology Conference",

pages = "262--268",

booktitle = "2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009",

note = "2009 59th Electronic Components and Technology Conference, ECTC 2009 ; Conference date: 26-05-2009 Through 29-05-2009",

}

Celik, E, Oterkus, E, Guven, I & Madenci, E 2009, Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. in 2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009., 5074026, Proceedings - Electronic Components and Technology Conference, pp. 262-268, 2009 59th Electronic Components and Technology Conference, ECTC 2009, San Diego, CA, United States, 05/26/09. https://doi.org/10.1109/ECTC.2009.5074026

Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. / Celik, Emrah; Oterkus, Erkan; Guven, Ibrahim et al.
2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009. 2009. p. 262-268 5074026 (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

AU - Celik, Emrah

AU - Oterkus, Erkan

AU - Guven, Ibrahim

AU - Madenci, Erdogan

PY - 2009

Y1 - 2009

N2 - In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.

AB - In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.

UR - https://www.scopus.com/pages/publications/70349663754

U2 - 10.1109/ECTC.2009.5074026

DO - 10.1109/ECTC.2009.5074026

M3 - Conference contribution

AN - SCOPUS:70349663754

SN - 9781424444762

T3 - Proceedings - Electronic Components and Technology Conference

SP - 262

EP - 268

BT - 2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009

T2 - 2009 59th Electronic Components and Technology Conference, ECTC 2009

Y2 - 26 May 2009 through 29 May 2009

ER -

Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

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