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Merging Technologies: Light-weight, High-throughput Full-Shell Optics for X-ray Imaging

  • Suzanne Romaine
  • , Jaesub Hong
  • , Ricardo Bruni
  • , Martin Elvis
  • , Stephan D. Bongiorno
  • , Nicholas Thomas
  • , David Smith
  • , David Banks
  • , Amy Meekham
  • , Srikanth Panini Singam
  • , Chet O. Speegle
  • , Christopher Jensen
  • , Joseph Cerafice
  • , Sanjay Sampath
  • Harvard-Smithsonian Ctr. Astrophys.
  • NASA Marshall Space Flight Center
  • LLC

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

X-ray optics are an essential component of nearly all future X-ray astronomy missions. Nickel electroforming of full shell optics is well established and several existing X-ray astronomy missions have used the technique to fabricate Wolter mirror modules. Our innovative approach merges current electroform technology with lower density materials, replacing much of the electroformed nickel with ceramic material which has higher stiffness, higher hardness and lower mass when compared with current electroformed nickel large shell optics. This will lead to future cost effective missions with large effective area and lightweight optics. Below we describe our approach and present our most recent results.

Original languageEnglish
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy XII
EditorsJessica A. Gaskin, Daniele Spiga
PublisherSPIE
ISBN (Electronic)9781510691605
DOIs
StatePublished - Sep 19 2025
Event12th Optics for EUV, X-Ray, and Gamma-Ray Astronomy - San Diego, United States
Duration: Aug 4 2025Aug 7 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13626
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference12th Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Country/TerritoryUnited States
CitySan Diego
Period08/4/2508/7/25

Keywords

  • Electroformed Nickel Replication
  • Plasma Thermal Spray
  • Wolter optics
  • X-ray Optics

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