Abstract
We report an environmentally "green" method to improve adhesion at a polymer/metal interface by using supercritical carbon dioxide (scCO2). Spun-cast polystyrene (PS) and poly(methyl methacrylate) (PMMA) thin films on cleaned Si wafers were used for this study. Film thicknesses of both polymer films were prepared in the range of 100 Å to 1600 Å. We exposed the films to scCO2 in the pressure-temperature (P-T) range corresponding to the density-fluctuation ridge, where the excess swelling of both polymer films occurred, and then froze the swollen structures by quick evaporation of CO2. A chromium (Cr) layer with film thickness of 300-400 Å was deposited onto the exposed film by using an E-beam evaporator. X-ray reflectivity (XR) measurements showed that the interfacial width between the Cr and exposed polymer layers increased by a factor of about two compared with that without exposure to scCO2. In addition, the large interfacial broadening was found to occur irrespective of the thickness of both polymer films. After the XR measurements, the dewetting structures of the PS/Cr films induced by additional annealing were characterized by using atomic force microscopy, showing improved surface morphology in the exposed films. Contact angle measurements showed that a decrease in interfact'al tension with exposure to scCO2 accompanied the increase in interfacial width.
| Original language | English |
|---|---|
| Pages (from-to) | 751-764 |
| Number of pages | 14 |
| Journal | Journal of Adhesion |
| Volume | 81 |
| Issue number | 7-8 |
| DOIs | |
| State | Published - Jul 2005 |
Keywords
- Atomic force microscopy
- Contact angle
- Interfacial width
- Polymer thin films
- Supercritical carbon dioxide
- Vapor metal deposition
- X-ray reflectivity
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