Microstructure of Ca3Co4O9 single crystals and thin films

Y. F. Hu; E. Sutter; W. D. Si; Qiang Li

Microstructure of Ca₃Co₄O₉ single crystals and thin films

Y. F. Hu
, E. Sutter
, W. D. Si
, Qiang Li

Physics and Astronomy

Brookhaven National Laboratory Condensed Matter Physics and Materials Science Department
Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

We present a comparative study of the microstructure of Ca ₃Co₄O₉ single crystals and c-axis oriented Ca₃Co₄O₉ thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.

Original language	English
Title of host publication	Materials Research Society Symposium Proceedings
Pages	45-50
Number of pages	6
State	Published - 2006
Event	2005 Materials Research Society Fall Meeting - Boston, MA, United States Duration: Nov 28 2005 → Dec 2 2005

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	886
ISSN (Print)	0272-9172

Conference

Conference	2005 Materials Research Society Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	11/28/05 → 12/2/05

Cite this

@inproceedings{2086df0674ed4916afc88af444197c9b,

title = "Microstructure of Ca3Co4O9 single crystals and thin films",

abstract = "We present a comparative study of the microstructure of Ca 3Co4O9 single crystals and c-axis oriented Ca3Co4O9 thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.",

author = "Hu, \{Y. F.\} and E. Sutter and Si, \{W. D.\} and Qiang Li",

year = "2006",

language = "English",

isbn = "1558998403",

series = "Materials Research Society Symposium Proceedings",

pages = "45--50",

booktitle = "Materials Research Society Symposium Proceedings",

note = "2005 Materials Research Society Fall Meeting ; Conference date: 28-11-2005 Through 02-12-2005",

}

TY - GEN

T1 - Microstructure of Ca3Co4O9 single crystals and thin films

AU - Hu, Y. F.

AU - Sutter, E.

AU - Si, W. D.

AU - Li, Qiang

PY - 2006

Y1 - 2006

N2 - We present a comparative study of the microstructure of Ca 3Co4O9 single crystals and c-axis oriented Ca3Co4O9 thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.

AB - We present a comparative study of the microstructure of Ca 3Co4O9 single crystals and c-axis oriented Ca3Co4O9 thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.

UR - https://www.scopus.com/pages/publications/33646177650

M3 - Conference contribution

AN - SCOPUS:33646177650

SN - 1558998403

SN - 9781558998407

T3 - Materials Research Society Symposium Proceedings

SP - 45

EP - 50

BT - Materials Research Society Symposium Proceedings

T2 - 2005 Materials Research Society Fall Meeting

Y2 - 28 November 2005 through 2 December 2005

ER -

Microstructure of Ca₃Co₄O₉ single crystals and thin films

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