Skip to main navigation Skip to search Skip to main content

Microstructure studies of Ca 3Co 4O 9 thin films on glass substrates

  • Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

High-quality c-axis oriented Ca 3Co 4O 9 thin films have been grown on glass substrate by pulsed-laser deposition. Cross-sectional transmission electron microscopy (TEM) shows stacking faults abundant throughout the films. Detailed microstructure analysis showed that the film growth starts amorphous. However, once the amorphous material turns entirely into crystalline, areas/domains with layer sequencing can be seen. These are precursors after which the film begins to grow in a layer-by-layer fashion. The misalignment of the small grains that form originally are associated with the introduction of stacking faults.

Original languageEnglish
Title of host publicationElectroceramic Materials and Applications - Proceedings of the 6th Pacific Rim Conference on Ceramic and Glass Technology
Pages267-273
Number of pages7
StatePublished - 2006
Event6th Pacific Rim Conference on Ceramic and Glass Technology - Maui, Hawaii, United States
Duration: Sep 11 2005Sep 16 2005

Publication series

NameCeramic Transactions
Volume196
ISSN (Print)1042-1122

Conference

Conference6th Pacific Rim Conference on Ceramic and Glass Technology
Country/TerritoryUnited States
CityMaui, Hawaii
Period09/11/0509/16/05

Fingerprint

Dive into the research topics of 'Microstructure studies of Ca 3Co 4O 9 thin films on glass substrates'. Together they form a unique fingerprint.

Cite this