Multiple probe interactions in near-field imaging

P. Scott Carney; Jin Sun; John C. Schotland

doi:10.1109/LEOS.2006.278901

Multiple probe interactions in near-field imaging

P. Scott Carney
, Jin Sun
, John C. Schotland

Mechanical Engineering

University of Illinois at Urbana-Champaign
University of Pennsylvania

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem.

Original language	English
Title of host publication	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	691-692
Number of pages	2
ISBN (Print)	0780395557, 9780780395558
DOIs	https://doi.org/10.1109/LEOS.2006.278901
State	Published - 2006
Event	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada Duration: Oct 29 2006 → Nov 2 2006

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)	1092-8081

Conference

Conference	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/Territory	Canada
City	Montreal, QC
Period	10/29/06 → 11/2/06

Access to Document

10.1109/LEOS.2006.278901

Cite this

Carney, P. S., Sun, J., & Schotland, J. C. (2006). Multiple probe interactions in near-field imaging. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 691-692). Article 4054372 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.278901

@inproceedings{611b6f2641134203bae30ec02a0c19be,

title = "Multiple probe interactions in near-field imaging",

abstract = "We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem.",

author = "Carney, \{P. Scott\} and Jin Sun and Schotland, \{John C.\}",

year = "2006",

doi = "10.1109/LEOS.2006.278901",

language = "English",

isbn = "0780395557",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "691--692",

booktitle = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS",

note = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS ; Conference date: 29-10-2006 Through 02-11-2006",

}

Carney, PS, Sun, J & Schotland, JC 2006, Multiple probe interactions in near-field imaging. in 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS., 4054372, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Institute of Electrical and Electronics Engineers Inc., pp. 691-692, 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS, Montreal, QC, Canada, 10/29/06. https://doi.org/10.1109/LEOS.2006.278901

Multiple probe interactions in near-field imaging. / Carney, P. Scott; Sun, Jin; Schotland, John C.
19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. p. 691-692 4054372 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Multiple probe interactions in near-field imaging

AU - Carney, P. Scott

AU - Sun, Jin

AU - Schotland, John C.

PY - 2006

Y1 - 2006

N2 - We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem.

AB - We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem.

UR - https://www.scopus.com/pages/publications/39049154784

U2 - 10.1109/LEOS.2006.278901

DO - 10.1109/LEOS.2006.278901

M3 - Conference contribution

AN - SCOPUS:39049154784

SN - 0780395557

SN - 9780780395558

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

SP - 691

EP - 692

BT - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

Y2 - 29 October 2006 through 2 November 2006

ER -

Multiple probe interactions in near-field imaging

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