Skip to main navigation Skip to search Skip to main content

Nanometer-scale mechanism of phase-change optical recording as revealed by XAFS

  • A. V. Kolobov
  • , P. Fons
  • , J. Tominaga
  • , A. I. Frenkel
  • , A. L. Ankudinov
  • , T. Uruga
  • National Institute of Advanced Industrial Science and Technology
  • University of Washington
  • Japan Synchrotron Radiation Research Institute

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

We demonstrate that the Ge(Sb)-Te bond lengths in crystallized cubic Ge2Sb2Te5 (GST) are significantly lower than the values expected from the previous X-ray diffraction (XRD) analysis. At the same time, the second nearest-neighbour Te-Te distances are in perfect agreement with XRD. We conclude that the structure of GST is a distorted rocksalt structure. Upon amorphization, Ge-Te and Sb-Te bonds get shorter and stronger. This unusual behaviour is due to a switch of Ge atom from an octahedral symmetry position in the crystalline state into a tetrahedral symmetry position in the amorphous state. It is this switching of the Ge atoms that is responsible for the fast and stable media performance.

Original languageEnglish
Pages (from-to)69-74
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume246
Issue number1
DOIs
StatePublished - May 2006

Fingerprint

Dive into the research topics of 'Nanometer-scale mechanism of phase-change optical recording as revealed by XAFS'. Together they form a unique fingerprint.

Cite this