Nanoscale optical tomography using volume-scanning near-field microscopy

Jin Sun; John C. Schotland; Rainer Hillenbrand; P. Scott Carney

doi:10.1063/1.3224177

Nanoscale optical tomography using volume-scanning near-field microscopy

Jin Sun
, John C. Schotland
, Rainer Hillenbrand
, P. Scott Carney

Mechanical Engineering

University of Illinois at Urbana-Champaign
University of Pennsylvania
Ikerbasque Basque Foundation for Science

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

Original language	English
Article number	121108
Journal	Applied Physics Letters
Volume	95
Issue number	12
DOIs	https://doi.org/10.1063/1.3224177
State	Published - 2009

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10.1063/1.3224177

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title = "Nanoscale optical tomography using volume-scanning near-field microscopy",

abstract = "The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.",

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journal = "Applied Physics Letters",

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AU - Sun, Jin

AU - Schotland, John C.

AU - Hillenbrand, Rainer

AU - Carney, P. Scott

PY - 2009

Y1 - 2009

N2 - The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

AB - The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.

UR - https://www.scopus.com/pages/publications/70349687111

U2 - 10.1063/1.3224177

DO - 10.1063/1.3224177

M3 - Article

AN - SCOPUS:70349687111

SN - 0003-6951

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

M1 - 121108

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Nanoscale optical tomography using volume-scanning near-field microscopy

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