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Neutron and X-ray reflectivity measurements of polystyrene/polybromostyrene (PS/PBrS) interfaces

  • W. Zhao
  • , X. Zhao
  • , M. H. Rafailovich
  • , J. Sokolov
  • , T. Mansfield
  • , R. S. Stein
  • , R. C. Composto
  • , E. J. Kramer
  • , R. A.L. Jones
  • , M. Sansone
  • , M. Nelson
  • City University of New York
  • University of Massachusetts
  • University of Pennsylvania
  • Cornell University
  • University of Cambridge
  • ExxonMobil
  • Brookhaven National Laboratory

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

Comparative X-ray and neutron reflectivity (XR and NR) measurements were made to study interface formation in the highly immiscible polymer pair deuterated polystyrene/polybromostyrene (PS/PBrS). Since deuterium provides the scattering contrast for NR while electronic density differences give XR contrast, the experiments constitute independent high-resolution measurements of the same interface. For the (PBrS) (670K)/dPS(730K) interface we find the interfacial width, 39 ± 5 Å by XR and 41 ± 5 Å by NR to be in satisfactory agreement.

Original languageEnglish
Pages (from-to)43-46
Number of pages4
JournalPhysica B: Condensed Matter
Volume173
Issue number1-2
DOIs
StatePublished - Aug 1991

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