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New results for a novel oxygenated silicon material

  • Brunel University London

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

High resistivity FZ silicon diodes have been processed in order to increase their oxygen dimer (O2i) concentration. Deep level transient spectroscopy (DLTS) measurements have been performed after proton irradiation showing that the formation of the VO centre is suppressed. The substrates had a starting resistivity of 2-4 kΩ cm, with an oxygen concentration of 1015-1017 cm-3. This new material has potential applications in very high radiation environments such as particle detectors in future particle physics experiments.

Original languageEnglish
Pages (from-to)111-115
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume186
Issue number1-4
DOIs
StatePublished - Jan 2002

Keywords

  • DLTS
  • Oxygen
  • Oxygen dimer
  • Silicon detector

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