Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

S. Sánchez Majos; P. Achenbach; C. Ayerbe Gayoso; J. C. Bernauer; R. Böhm; M. O. Distler; M. Gómez Rodríguez de la Paz; H. Merkel; U. Müller; L. Nungesser; J. Pochodzalla; B. S. Schlimme; Th Walcher; M. Weinriefer; C. J. Yoon

doi:10.1016/j.nima.2009.01.176

Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

S. Sánchez Majos
, P. Achenbach
, C. Ayerbe Gayoso
, J. C. Bernauer
, R. Böhm
, M. O. Distler
, M. Gómez Rodríguez de la Paz
, H. Merkel
, U. Müller
, L. Nungesser
, J. Pochodzalla
, B. S. Schlimme
, Th Walcher
, M. Weinriefer
, C. J. Yoon

Physics and Astronomy

Johannes Gutenberg University Mainz

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.

Original language	English
Pages (from-to)	506-510
Number of pages	5
Journal	Nuclear Inst. and Methods in Physics Research, A
Volume	602
Issue number	2
DOIs	https://doi.org/10.1016/j.nima.2009.01.176
State	Published - Apr 21 2009

Keywords

Particle detector design
Radiation damage
Silicon photomultiplier
Tracking and position-sensitive detectors

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10.1016/j.nima.2009.01.176

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Sánchez Majos, S., Achenbach, P., Ayerbe Gayoso, C., Bernauer, J. C., Böhm, R., Distler, M. O., Gómez Rodríguez de la Paz, M., Merkel, H., Müller, U., Nungesser, L., Pochodzalla, J., Schlimme, B. S., Walcher, T., Weinriefer, M., & Yoon, C. J. (2009). Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation. Nuclear Inst. and Methods in Physics Research, A, 602(2), 506-510. https://doi.org/10.1016/j.nima.2009.01.176

@article{4ac5b77ea12b4d1ab3bf28336d90d615,

title = "Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation",

abstract = "For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.",

keywords = "Particle detector design, Radiation damage, Silicon photomultiplier, Tracking and position-sensitive detectors",

author = "\{S{\'a}nchez Majos\}, S. and P. Achenbach and \{Ayerbe Gayoso\}, C. and Bernauer, \{J. C.\} and R. B{\"o}hm and Distler, \{M. O.\} and \{G{\'o}mez Rodr{\'i}guez de la Paz\}, M. and H. Merkel and U. M{\"u}ller and L. Nungesser and J. Pochodzalla and Schlimme, \{B. S.\} and Th Walcher and M. Weinriefer and Yoon, \{C. J.\}",

year = "2009",

month = apr,

day = "21",

doi = "10.1016/j.nima.2009.01.176",

language = "English",

volume = "602",

pages = "506--510",

journal = "Nuclear Inst. and Methods in Physics Research, A",

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Sánchez Majos, S, Achenbach, P, Ayerbe Gayoso, C, Bernauer, JC, Böhm, R, Distler, MO, Gómez Rodríguez de la Paz, M, Merkel, H, Müller, U, Nungesser, L, Pochodzalla, J, Schlimme, BS, Walcher, T, Weinriefer, M & Yoon, CJ 2009, 'Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation', Nuclear Inst. and Methods in Physics Research, A, vol. 602, no. 2, pp. 506-510. https://doi.org/10.1016/j.nima.2009.01.176

TY - JOUR

T1 - Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

AU - Sánchez Majos, S.

AU - Achenbach, P.

AU - Ayerbe Gayoso, C.

AU - Bernauer, J. C.

AU - Böhm, R.

AU - Distler, M. O.

AU - Gómez Rodríguez de la Paz, M.

AU - Merkel, H.

AU - Müller, U.

AU - Nungesser, L.

AU - Pochodzalla, J.

AU - Schlimme, B. S.

AU - Walcher, Th

AU - Weinriefer, M.

AU - Yoon, C. J.

PY - 2009/4/21

Y1 - 2009/4/21

N2 - For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.

AB - For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.

KW - Particle detector design

KW - Radiation damage

KW - Silicon photomultiplier

KW - Tracking and position-sensitive detectors

UR - https://www.scopus.com/pages/publications/63149127996

U2 - 10.1016/j.nima.2009.01.176

DO - 10.1016/j.nima.2009.01.176

M3 - Article

AN - SCOPUS:63149127996

SN - 0168-9002

VL - 602

SP - 506

EP - 510

JO - Nuclear Inst. and Methods in Physics Research, A

JF - Nuclear Inst. and Methods in Physics Research, A

IS - 2

ER -

Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

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