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Noise model, analysis and characterization of a differential active pixel sensor

  • University of Maryland, College Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We report the design, analytical model and experimental noise performance from a photo sensor fabricated in a 0.5 μm commercial CMOS process. The sensor is a novel differential active pixel sensor which performs in-pixel correlated double sampling (CDS) to reduce correlated and environmental noise at the expense of increased thermally generated noise sources such as reset and readout noise. In comparison with a representative single ended sensor, the differential sensor exhibits an increased fundamental reset and readout noise of 117% and 58% respectively.

Original languageEnglish
Title of host publication2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Pages1780-1783
Number of pages4
DOIs
StatePublished - 2008
Event2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
Duration: May 18 2008May 21 2008

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Country/TerritoryUnited States
CitySeattle, WA
Period05/18/0805/21/08

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