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Numerical simulation of atomic layer deposition for thin deposit formation in a mesoporous substrate

  • Liwei Zhuang
  • , Peter Corkery
  • , Dennis T. Lee
  • , Seungjoon Lee
  • , Mahdi Kooshkbaghi
  • , Zhen liang Xu
  • , Gance Dai
  • , Ioannis G. Kevrekidis
  • , Michael Tsapatsis
  • East China University of Science and Technology
  • Johns Hopkins University
  • Princeton University
  • Johns Hopkins University Applied Physics Laboratory

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

ZnO deposition in porous γ-Al2O3 via atomic layer deposition (ALD) is the critical first step for the fabrication of zeolitic imidazolate framework membranes using the ligand-induced perm-selectivation process (Science, 361 (2018), 1008–1011). A detailed computational fluid dynamics (CFD) model of the ALD reactor is developed using a finite-volume-based code and validated. It accounts for the transport processes within the feeding system and reaction chamber. The simulated precursor spatiotemporal profiles assuming no ALD reaction were used as boundary conditions in modeling diethylzinc reaction/diffusion in porous γ-Al2O3, the predictions of which agreed with experimental electron microscopy measurements. Further simulations confirmed that the present deposition flux is much less than the upper limit of flux, below which the decoupling of reactor/substrate is an accurate assumption. The modeling approach demonstrated here allows for the design of ALD processes for thin-film membrane formation including the synthesis of metal–organic framework membranes.

Original languageEnglish
Article numbere17305
JournalAIChE Journal
Volume67
Issue number8
DOIs
StatePublished - Aug 2021

Keywords

  • atomic layer deposition
  • computational fluid dynamics
  • membrane
  • zeolitic imidazolate framework, zinc oxide

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