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Observation of self-amplified spontaneous emission in the near-infrared and visible wavelengths

  • M. Babzien
  • , I. Ben-Zvi
  • , P. Catravas
  • , J. M. Fang
  • , T. C. Marshall
  • , X. J. Wang
  • , J. S. Wurtele
  • , V. Yakimenko
  • , L. H. Yu
  • Brookhaven National Laboratory
  • Massachusetts Institute of Technology
  • Columbia University
  • University of California at Berkeley

Research output: Contribution to journalArticlepeer-review

42 Scopus citations

Abstract

We report evidence of self-amplified spontaneous emission (SASE) at 1064 and 633 nm. To our knowledge, these are the first measurements of SASE at such a short wavelength and employ the smallest period wiggler, 8.8 mm, used to date in a successful SASE experiment. The experiments were performed with the MIT microwiggler at the Accelerator Test Facility at BNL. Single-pass, on-axis microwiggler emissions within a 25 nm bandwidth have been recorded as a function of beam charge and show a clear enhancement over spontaneous emission. For the measurement at 1064 nm, a single micropulse at 34 MeV with a variable charge of 0–1 nC and less than 5 ps full width at half maximum bunch length was passed through the microwiggler and emissions into a limited solid angle and bandwidth, selected by an aperture and interference filter, were focused onto a silicon photodiode. Enhancement of the emissions, from 2 to 6 times the spontaneous emission level, was observed at the highest charges. In addition, we observed SASE gain at a wavelength of 633 nm at a beam energy of 48 MeV, without detailed measurements.

Original languageEnglish
Pages (from-to)6093-6100
Number of pages8
JournalPhysical Review E
Volume57
Issue number5
DOIs
StatePublished - 1998

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