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OccludeNeRF: Geometry-Aware 3D Scene Inpainting with Collaborative Score Distillation in NeRF

  • Jingyu Shi
  • , Achleshwar Luthra
  • , Jiazhi Li
  • , Xiang Gao
  • , Xiyun Song
  • , Zongfang Lin
  • , David Gu
  • , Heather Yu
  • Purdue University
  • Texas A&M University
  • University of Southern California
  • Stony Brook University
  • Futurewei Technologies, Inc.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With Neural Radiance Fields (NeRFs) arising as a powerful 3D representation, research has investigated its various downstream tasks, including inpainting NeRFs with 2D images. Despite successful efforts addressing the view consistency and geometry quality, prior methods yet suffer from occlusion in NeRF inpainting tasks, where 2D prior is severely limited in forming a faithful reconstruction of the scene to inpaint. To address this, we propose a novel approach that enables cross-view information sharing during knowledge distillation from a diffusion model, effectively propagating occluded information across limited views. Additionally, to align the distillation direction across multiple sampled views, we apply a grid-based denoising strategy and incorporate additional rendered views to enhance cross-view consistency. To assess our approach's capability of handling occlusion cases, we construct a dataset consisting of challenging scenes with severe occlusion, in addition to existing datasets. Compared with baseline methods, our method demonstrates better performance in cross-view consistency and faithfulness in reconstruction, while preserving high rendering quality and fidelity.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
PublisherIEEE Computer Society
Pages284-294
Number of pages11
ISBN (Electronic)9798331599942
DOIs
StatePublished - 2025
Event2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025 - Nashville, United States
Duration: Jun 11 2025Jun 12 2025

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
Country/TerritoryUnited States
CityNashville
Period06/11/2506/12/25

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