On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems

Arash Karimi; Zachery B. Harris; M. Hassan Arbab

doi:10.1117/12.3082245

On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems

Arash Karimi
, Zachery B. Harris
, M. Hassan Arbab

Biomedical Engineering

Stony Brook University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Polarization-resolved measurements are powerful tools for probing material properties from IR to UV enabling a wide range of applications. The extension of these applications to terahertz (THz) frequencies requires dedicated instrumentation capable of THz polarization-sensitive measurements together with robust calibration strategies. Terahertz time-domain polarimetry (THz-TDP) provides broadband amplitude- and phase-resolved polarimetric information suitable for probing low-energy resonance phenomena. However, THz-TDP instrumentation remains underdeveloped compared to its optical counterparts. In this work, we introduce an in situ technique using a rotating wire grid polarizer for the calibration of THz-TDP systems. Due to the broadband nature of the THz-TDP systems, the frequency response of the polarizer plays a crucial role in the accuracy of this calibration. The proposed in situ calibration simultaneously extracts the frequency-dependent leakage of the polarizer and the system calibration parameters, enabling accurate THz-TDP measurements without the need for separate polarizer characterization.

Original language	English
Title of host publication	Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIX
Editors	Laurence P. Sadwick, Tianxin Yang
Publisher	SPIE
ISBN (Electronic)	9781510697072
DOIs	https://doi.org/10.1117/12.3082245
State	Published - Mar 5 2026
Event	19th Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications - San Francisco, United States Duration: Jan 19 2026 → Jan 22 2026

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	13895
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	19th Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications
Country/Territory	United States
City	San Francisco
Period	01/19/26 → 01/22/26

Keywords

Terahertz time-domain spectroscopy
polarimetry
polarimetry calibration
polarizer
terahertz time-domain polarimetry
wire grid polarizer

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10.1117/12.3082245

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Karimi, A., Harris, Z. B., & Arbab, M. H. (2026). On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems. In L. P. Sadwick, & T. Yang (Eds.), Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIX Article 138950H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13895). SPIE. https://doi.org/10.1117/12.3082245

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title = "On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems",

abstract = "Polarization-resolved measurements are powerful tools for probing material properties from IR to UV enabling a wide range of applications. The extension of these applications to terahertz (THz) frequencies requires dedicated instrumentation capable of THz polarization-sensitive measurements together with robust calibration strategies. Terahertz time-domain polarimetry (THz-TDP) provides broadband amplitude- and phase-resolved polarimetric information suitable for probing low-energy resonance phenomena. However, THz-TDP instrumentation remains underdeveloped compared to its optical counterparts. In this work, we introduce an in situ technique using a rotating wire grid polarizer for the calibration of THz-TDP systems. Due to the broadband nature of the THz-TDP systems, the frequency response of the polarizer plays a crucial role in the accuracy of this calibration. The proposed in situ calibration simultaneously extracts the frequency-dependent leakage of the polarizer and the system calibration parameters, enabling accurate THz-TDP measurements without the need for separate polarizer characterization.",

keywords = "Terahertz time-domain spectroscopy, polarimetry, polarimetry calibration, polarizer, terahertz time-domain polarimetry, wire grid polarizer",

author = "Arash Karimi and Harris, \{Zachery B.\} and Arbab, \{M. Hassan\}",

note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE.; 19th Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications ; Conference date: 19-01-2026 Through 22-01-2026",

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Karimi, A, Harris, ZB & Arbab, MH 2026, On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems. in LP Sadwick & T Yang (eds), Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIX., 138950H, Proceedings of SPIE - The International Society for Optical Engineering, vol. 13895, SPIE, 19th Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications, San Francisco, United States, 01/19/26. https://doi.org/10.1117/12.3082245

On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems. / Karimi, Arash; Harris, Zachery B.; Arbab, M. Hassan.
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIX. ed. / Laurence P. Sadwick; Tianxin Yang. SPIE, 2026. 138950H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13895).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems

AU - Karimi, Arash

AU - Harris, Zachery B.

AU - Arbab, M. Hassan

N1 - Publisher Copyright: © COPYRIGHT SPIE.

PY - 2026/3/5

Y1 - 2026/3/5

N2 - Polarization-resolved measurements are powerful tools for probing material properties from IR to UV enabling a wide range of applications. The extension of these applications to terahertz (THz) frequencies requires dedicated instrumentation capable of THz polarization-sensitive measurements together with robust calibration strategies. Terahertz time-domain polarimetry (THz-TDP) provides broadband amplitude- and phase-resolved polarimetric information suitable for probing low-energy resonance phenomena. However, THz-TDP instrumentation remains underdeveloped compared to its optical counterparts. In this work, we introduce an in situ technique using a rotating wire grid polarizer for the calibration of THz-TDP systems. Due to the broadband nature of the THz-TDP systems, the frequency response of the polarizer plays a crucial role in the accuracy of this calibration. The proposed in situ calibration simultaneously extracts the frequency-dependent leakage of the polarizer and the system calibration parameters, enabling accurate THz-TDP measurements without the need for separate polarizer characterization.

AB - Polarization-resolved measurements are powerful tools for probing material properties from IR to UV enabling a wide range of applications. The extension of these applications to terahertz (THz) frequencies requires dedicated instrumentation capable of THz polarization-sensitive measurements together with robust calibration strategies. Terahertz time-domain polarimetry (THz-TDP) provides broadband amplitude- and phase-resolved polarimetric information suitable for probing low-energy resonance phenomena. However, THz-TDP instrumentation remains underdeveloped compared to its optical counterparts. In this work, we introduce an in situ technique using a rotating wire grid polarizer for the calibration of THz-TDP systems. Due to the broadband nature of the THz-TDP systems, the frequency response of the polarizer plays a crucial role in the accuracy of this calibration. The proposed in situ calibration simultaneously extracts the frequency-dependent leakage of the polarizer and the system calibration parameters, enabling accurate THz-TDP measurements without the need for separate polarizer characterization.

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PB - SPIE

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Y2 - 19 January 2026 through 22 January 2026

ER -

On the impact of imperfect polarizers for the calibration of polarimetric terahertz systems

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