Abstract
Pair distribution function (PDF) methods have great potential for the study of diverse high-pressure phenomena. However, the measurement of high-quality, high-resolution X-ray PDF data (to Qmax > 20 Å-1) remains a technical challenge. An optimized approach to measuring high-pressure total scattering data for samples contained within a diamond anvil cell (DAC) is presented here. This method takes into account the coupled influences of instrument parameters (photon energy, detector type and positioning, beam size/shape, focusing), pressure-cell parameters (target pressure range, DAC type, diamonds, pressure-transmitting media, backing plates, pressure calibration) and data reduction on the resulting PDF. The efficacy of our approach is demonstrated by the high-quality, high-pressure PDFs obtained for representative materials spanning strongly and weakly scattering systems, and crystalline and amorphous samples. These are the highest-resolution high-pressure PDFs reported to date and include those for-alumina (to Q max = 20 Å-1), BaTiO3 (to Qmax = 30 Å-1) and pressure-amorphized zeolite (to Qmax = 20 Å-1).
| Original language | English |
|---|---|
| Pages (from-to) | 297-307 |
| Number of pages | 11 |
| Journal | Journal of Applied Crystallography |
| Volume | 43 |
| Issue number | 2 |
| DOIs | |
| State | Published - 2010 |
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