Origins of twinned microstructures in B12As2 epilayers grown on (0001) 6H-SiC and their influence on physical properties

Yu Zhang; Hui Chen; Ning Zhang; Michael Dudley; Yinyan Gong; Martin Kuball; Zhou Xu; Yi Zhang; James H. Edgar; Lihua Zhang; Yimei Zhu

Origins of twinned microstructures in B₁₂As₂ epilayers grown on (0001) 6H-SiC and their influence on physical properties

Yu Zhang
, Hui Chen
, Ning Zhang
, Michael Dudley
, Yinyan Gong
, Martin Kuball
, Zhou Xu
, Yi Zhang
, James H. Edgar
, Lihua Zhang
, Yimei Zhu

Materials Science and Engineering

Stony Brook University
University of Bristol
Kansas State University
Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The defect structure in B₁₂As₂ epitaxial layers grown at two different temperatures on (0001) 6H-SiC by chemical vapor deposition (CVD) was studied using synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM). The observed differences in microstructures were correlated with the differences in nucleation at the two growth temperatures. The effect of the difference in microstructure on macroscopic properties of the B₁₂As₂ was illustrated using the example of thermal conductivity which was measured using the 3-ω technique. The relationship between the measured thermal conductivity and observed microstructures is discussed.

Original language	English
Title of host publication	Nuclear Radiation Detection Materials - 2009
Pages	121-127
Number of pages	7
State	Published - 2010
Event	2009 MRS Spring Meeting - San Francisco, CA, United States Duration: Apr 14 2009 → Apr 17 2009

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1164
ISSN (Print)	0272-9172

Conference

Conference	2009 MRS Spring Meeting
Country/Territory	United States
City	San Francisco, CA
Period	04/14/09 → 04/17/09

Cite this

Zhang, Y., Chen, H., Zhang, N., Dudley, M., Gong, Y., Kuball, M., Xu, Z., Zhang, Y., Edgar, J. H., Zhang, L., & Zhu, Y. (2010). Origins of twinned microstructures in B₁₂As₂ epilayers grown on (0001) 6H-SiC and their influence on physical properties. In Nuclear Radiation Detection Materials - 2009 (pp. 121-127). (Materials Research Society Symposium Proceedings; Vol. 1164).

@inproceedings{a6a0b499bc0b4e4ba79d57b7acc3c098,

title = "Origins of twinned microstructures in B12As2 epilayers grown on (0001) 6H-SiC and their influence on physical properties",

abstract = "The defect structure in B12As2 epitaxial layers grown at two different temperatures on (0001) 6H-SiC by chemical vapor deposition (CVD) was studied using synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM). The observed differences in microstructures were correlated with the differences in nucleation at the two growth temperatures. The effect of the difference in microstructure on macroscopic properties of the B12As2 was illustrated using the example of thermal conductivity which was measured using the 3-ω technique. The relationship between the measured thermal conductivity and observed microstructures is discussed.",

author = "Yu Zhang and Hui Chen and Ning Zhang and Michael Dudley and Yinyan Gong and Martin Kuball and Zhou Xu and Yi Zhang and Edgar, \{James H.\} and Lihua Zhang and Yimei Zhu",

year = "2010",

language = "English",

isbn = "9781605111377",

series = "Materials Research Society Symposium Proceedings",

pages = "121--127",

booktitle = "Nuclear Radiation Detection Materials - 2009",

note = "2009 MRS Spring Meeting ; Conference date: 14-04-2009 Through 17-04-2009",

}

Zhang, Y, Chen, H, Zhang, N, Dudley, M, Gong, Y, Kuball, M, Xu, Z, Zhang, Y, Edgar, JH, Zhang, L & Zhu, Y 2010, Origins of twinned microstructures in B₁₂As₂ epilayers grown on (0001) 6H-SiC and their influence on physical properties. in Nuclear Radiation Detection Materials - 2009. Materials Research Society Symposium Proceedings, vol. 1164, pp. 121-127, 2009 MRS Spring Meeting, San Francisco, CA, United States, 04/14/09.

Origins of twinned microstructures in B₁₂As₂ epilayers grown on (0001) 6H-SiC and their influence on physical properties. / Zhang, Yu; Chen, Hui; Zhang, Ning et al.
Nuclear Radiation Detection Materials - 2009. 2010. p. 121-127 (Materials Research Society Symposium Proceedings; Vol. 1164).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Origins of twinned microstructures in B12As2 epilayers grown on (0001) 6H-SiC and their influence on physical properties

AU - Zhang, Yu

AU - Chen, Hui

AU - Zhang, Ning

AU - Dudley, Michael

AU - Gong, Yinyan

AU - Kuball, Martin

AU - Xu, Zhou

AU - Zhang, Yi

AU - Edgar, James H.

AU - Zhang, Lihua

AU - Zhu, Yimei

PY - 2010

Y1 - 2010

N2 - The defect structure in B12As2 epitaxial layers grown at two different temperatures on (0001) 6H-SiC by chemical vapor deposition (CVD) was studied using synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM). The observed differences in microstructures were correlated with the differences in nucleation at the two growth temperatures. The effect of the difference in microstructure on macroscopic properties of the B12As2 was illustrated using the example of thermal conductivity which was measured using the 3-ω technique. The relationship between the measured thermal conductivity and observed microstructures is discussed.

AB - The defect structure in B12As2 epitaxial layers grown at two different temperatures on (0001) 6H-SiC by chemical vapor deposition (CVD) was studied using synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM). The observed differences in microstructures were correlated with the differences in nucleation at the two growth temperatures. The effect of the difference in microstructure on macroscopic properties of the B12As2 was illustrated using the example of thermal conductivity which was measured using the 3-ω technique. The relationship between the measured thermal conductivity and observed microstructures is discussed.

UR - https://www.scopus.com/pages/publications/77952026649

M3 - Conference contribution

AN - SCOPUS:77952026649

SN - 9781605111377

T3 - Materials Research Society Symposium Proceedings

SP - 121

EP - 127

BT - Nuclear Radiation Detection Materials - 2009

T2 - 2009 MRS Spring Meeting

Y2 - 14 April 2009 through 17 April 2009

ER -

Origins of twinned microstructures in B₁₂As₂ epilayers grown on (0001) 6H-SiC and their influence on physical properties

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