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Performance evaluation of different Depth From Defocus (DFD) techniques

  • Stony Brook University

Research output: Contribution to journalConference articlepeer-review

17 Scopus citations

Abstract

In this paper, several binary mask based Depth From Defocus (DFD) algorithms are proposed to improve autofocusing performance and robustness. A binary mask is defined by thresholding image Laplacian to remove unreliable points with low Signal-to-Noise Ratio (SNR). Three different DFD schemes- with/without spatial integration and with/without squaring- are investigated and evaluated, both through simulation and actual experiments. The actual experiments use a large variety of objects including very low contrast Ogata test charts. Experimental results show that autofocusing RMS step error is less than 2.6 lens steps, which corresponds to 1.73%. Although our discussion in this paper is mainly focused on a spatial domain method STM1, this technique should be of general value for different approaches such as STM2 and other spatial domain based algorithms.

Original languageEnglish
Article number600009
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume6000
DOIs
StatePublished - 2005
EventTwo- and Three-Dimensional Methods for Inspection and Metrology III - Boston, MA, United States
Duration: Oct 24 2005Oct 26 2005

Keywords

  • Autofocusing
  • Binary mask
  • Depth From Defocus (DFD)
  • Reliable point
  • Spatial integration
  • Squaring scheme

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