Abstract
In this paper, several binary mask based Depth From Defocus (DFD) algorithms are proposed to improve autofocusing performance and robustness. A binary mask is defined by thresholding image Laplacian to remove unreliable points with low Signal-to-Noise Ratio (SNR). Three different DFD schemes- with/without spatial integration and with/without squaring- are investigated and evaluated, both through simulation and actual experiments. The actual experiments use a large variety of objects including very low contrast Ogata test charts. Experimental results show that autofocusing RMS step error is less than 2.6 lens steps, which corresponds to 1.73%. Although our discussion in this paper is mainly focused on a spatial domain method STM1, this technique should be of general value for different approaches such as STM2 and other spatial domain based algorithms.
| Original language | English |
|---|---|
| Article number | 600009 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 6000 |
| DOIs | |
| State | Published - 2005 |
| Event | Two- and Three-Dimensional Methods for Inspection and Metrology III - Boston, MA, United States Duration: Oct 24 2005 → Oct 26 2005 |
Keywords
- Autofocusing
- Binary mask
- Depth From Defocus (DFD)
- Reliable point
- Spatial integration
- Squaring scheme
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