Abstract
At critical current density of the order of 100 kA/cm 2, tunnel Josephson junctions become overdamped and may be used in RSFQ circuits without external shunting, dramatically increasing circuit density. However, the physics of electron transport in such high-j c junctions differs from the usual direct tunneling and until recently remained unclear. We have found that the observed dc I-V curves of niobium-trilayer junctions with j c = 210 kA/cm 2 can be explained quantitatively by resonant tunneling through strongly disordered barriers. According to this interpretation, random spread of critical current in high-j c junctions may be rather small (below 1% r.m.s.) even in deep-submicron junctions, making VLSI RSFQ circuits, with density above 10 MJJ/cm 2, feasible.
| Original language | English |
|---|---|
| Pages (from-to) | 1056-1061 |
| Number of pages | 6 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 11 |
| Issue number | 1 I |
| DOIs | |
| State | Published - Mar 2001 |
| Event | 2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: Sep 17 2000 → Sep 22 2000 |
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