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Power and data integrity in monolithic 3D integrated simon core

  • Stony Brook University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Monolithic 3D ICs have vertical interconnects that are comparable in size to local vias, thereby permitting extremely fine-grained vertical integration. SIMON, a lightweight block cipher, is designed and characterized at the Graphic Database System (GDS) level in two types of monolithic 3D design styles: transistor-level, where nMOS and pMOS transistors are split between tiers, and gate-level, where individual gates are partitioned among the tiers. The two 3D implementations as well as a 2D implementation are compared and characterized in terms of area and power. Furthermore, the effect of monolithic inter-tier vias (MIVs) on power and data integrity is analyzed for each custom 3D design. It is shown that power delivery for transistor-level monolithic 3D design is more challenging since all of the pMOS transistors (that are connected to the supply voltage) are located in the bottom tier where there are limited metal resources due to technology constraints.

Original languageEnglish
Title of host publication2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728103976
DOIs
StatePublished - 2019
Event2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Sapporo, Japan
Duration: May 26 2019May 29 2019

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2019-May
ISSN (Print)0271-4310

Conference

Conference2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
Country/TerritoryJapan
CitySapporo
Period05/26/1905/29/19

Keywords

  • Ground bounce
  • Monolithic 3D integration
  • Power delivery networks
  • Power integrity

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