Probe diffusion in thin PS free-standing films

Y. Pu; H. White; M. H. Rafailovich; J. Sokolov; A. Patel; C. White; W. L. Wu; V. Zaitsev; S. A. Schwarz

doi:10.1021/ma002183f

Probe diffusion in thin PS free-standing films

Y. Pu
, H. White
, M. H. Rafailovich
, J. Sokolov
, A. Patel
, C. White
, W. L. Wu
, V. Zaitsev
, S. A. Schwarz

Materials Science and Engineering

Stony Brook University
National Institute of Standards and Technology
City University of New York

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

Abstract

Dynamic secondary ion mass spectrometry was performed to determine the dynamics of thin free-standing polystyrene films by investigating probe diffusion in a high molecular weight polymer matrix. It is found that the temperature dependence of the diffusion of small molecular probes can be described by the WLF equation above bulk T_g, whereas a weaker dependence is found below T_g for PS films with total thickness as thin as 69 nm. The results of probe diffusion as a function of film thicknesses show no change of T_g for the free-standing films with thickness ranging from 33 to 200 nm.

Original language	English
Pages (from-to)	8518-8522
Number of pages	5
Journal	Macromolecules
Volume	34
Issue number	24
DOIs	https://doi.org/10.1021/ma002183f
State	Published - Nov 20 2001

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10.1021/ma002183f

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title = "Probe diffusion in thin PS free-standing films",

abstract = "Dynamic secondary ion mass spectrometry was performed to determine the dynamics of thin free-standing polystyrene films by investigating probe diffusion in a high molecular weight polymer matrix. It is found that the temperature dependence of the diffusion of small molecular probes can be described by the WLF equation above bulk Tg, whereas a weaker dependence is found below Tg for PS films with total thickness as thin as 69 nm. The results of probe diffusion as a function of film thicknesses show no change of Tg for the free-standing films with thickness ranging from 33 to 200 nm.",

author = "Y. Pu and H. White and Rafailovich, \{M. H.\} and J. Sokolov and A. Patel and C. White and Wu, \{W. L.\} and V. Zaitsev and Schwarz, \{S. A.\}",

year = "2001",

month = nov,

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doi = "10.1021/ma002183f",

language = "English",

volume = "34",

pages = "8518--8522",

journal = "Macromolecules",

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TY - JOUR

T1 - Probe diffusion in thin PS free-standing films

AU - Pu, Y.

AU - White, H.

AU - Rafailovich, M. H.

AU - Sokolov, J.

AU - Patel, A.

AU - White, C.

AU - Wu, W. L.

AU - Zaitsev, V.

AU - Schwarz, S. A.

PY - 2001/11/20

Y1 - 2001/11/20

N2 - Dynamic secondary ion mass spectrometry was performed to determine the dynamics of thin free-standing polystyrene films by investigating probe diffusion in a high molecular weight polymer matrix. It is found that the temperature dependence of the diffusion of small molecular probes can be described by the WLF equation above bulk Tg, whereas a weaker dependence is found below Tg for PS films with total thickness as thin as 69 nm. The results of probe diffusion as a function of film thicknesses show no change of Tg for the free-standing films with thickness ranging from 33 to 200 nm.

AB - Dynamic secondary ion mass spectrometry was performed to determine the dynamics of thin free-standing polystyrene films by investigating probe diffusion in a high molecular weight polymer matrix. It is found that the temperature dependence of the diffusion of small molecular probes can be described by the WLF equation above bulk Tg, whereas a weaker dependence is found below Tg for PS films with total thickness as thin as 69 nm. The results of probe diffusion as a function of film thicknesses show no change of Tg for the free-standing films with thickness ranging from 33 to 200 nm.

UR - https://www.scopus.com/pages/publications/0035923472

U2 - 10.1021/ma002183f

DO - 10.1021/ma002183f

M3 - Article

AN - SCOPUS:0035923472

SN - 0024-9297

VL - 34

SP - 8518

EP - 8522

JO - Macromolecules

JF - Macromolecules

IS - 24

ER -

Probe diffusion in thin PS free-standing films

Abstract

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