TY - GEN
T1 - Pulsed ToF LiDAR-Based Depth Imaging
T2 - 2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
AU - Noyan, Utku
AU - Lu, Sheung
AU - Al-Shabili, Abdullah
AU - Dandin, Marc
AU - Chan, Stanley H.
AU - Abshire, Pamela
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Pulsed Time-of-Flight (ToF) LiDAR is a crucial technology for acquiring depth information in various applications, including autonomous vehicles, robotics, and 3D mapping. Single-Photon Avalanche Diodes (SPADs) are widely employed as detectors in these systems due to their fast response and high sensitivity. This paper investigates pulsed ToF LiDAR-based depth imaging to clarify the hardware design considerations that affect depth estimation accuracy. We present a simulation study that investigates the performance of SPAD-based LiDAR systems under various conditions, offering insights into the design of SPAD circuits for improved depth imaging performance. We find that, as expected, accuracy and depth resolution depend strongly on the fill factor, with accuracy decreasing as the fill factor drops, gradually at first and then more steeply for fill characteristics of less than 50%. Lastly, we discuss the outcomes of our simulations and suggest directions for future research in this area.
AB - Pulsed Time-of-Flight (ToF) LiDAR is a crucial technology for acquiring depth information in various applications, including autonomous vehicles, robotics, and 3D mapping. Single-Photon Avalanche Diodes (SPADs) are widely employed as detectors in these systems due to their fast response and high sensitivity. This paper investigates pulsed ToF LiDAR-based depth imaging to clarify the hardware design considerations that affect depth estimation accuracy. We present a simulation study that investigates the performance of SPAD-based LiDAR systems under various conditions, offering insights into the design of SPAD circuits for improved depth imaging performance. We find that, as expected, accuracy and depth resolution depend strongly on the fill factor, with accuracy decreasing as the fill factor drops, gradually at first and then more steeply for fill characteristics of less than 50%. Lastly, we discuss the outcomes of our simulations and suggest directions for future research in this area.
KW - Autonomous vehicles Circuit considerations
KW - Depth imaging
KW - Pulsed Time-of-Flight (ToF) LiDAR
KW - Single-Photon Avalanche Diodes (SPADs)
UR - https://www.scopus.com/pages/publications/85185383156
U2 - 10.1109/MWSCAS57524.2023.10405999
DO - 10.1109/MWSCAS57524.2023.10405999
M3 - Conference contribution
AN - SCOPUS:85185383156
T3 - Midwest Symposium on Circuits and Systems
SP - 875
EP - 879
BT - 2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 6 August 2023 through 9 August 2023
ER -