Revealing the origin of phonon glass-electron crystal behavior in thermoelectric layered cobaltate by accurate displacement measurement

L. Wu; Q. Meng; Ch Jooss; J. C. Zheng; H. Inada; D. Su; Q. Li; Y. Zhu

doi:10.1017/S1431927614003894

Revealing the origin of phonon glass-electron crystal behavior in thermoelectric layered cobaltate by accurate displacement measurement

L. Wu
, Q. Meng
, Ch Jooss
, J. C. Zheng
, H. Inada
, D. Su
, Q. Li
, Y. Zhu

Physics and Astronomy

Brookhaven National Laboratory
University of Göttingen
Xiamen University
Hitachi, Ltd.

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	434-435
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614003894
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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title = "Revealing the origin of phonon glass-electron crystal behavior in thermoelectric layered cobaltate by accurate displacement measurement",

author = "L. Wu and Q. Meng and Ch Jooss and Zheng, \{J. C.\} and H. Inada and D. Su and Q. Li and Y. Zhu",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614003894",

language = "English",

volume = "20",

pages = "434--435",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Revealing the origin of phonon glass-electron crystal behavior in thermoelectric layered cobaltate by accurate displacement measurement

AU - Wu, L.

AU - Meng, Q.

AU - Jooss, Ch

AU - Zheng, J. C.

AU - Inada, H.

AU - Su, D.

AU - Li, Q.

AU - Zhu, Y.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927932543

U2 - 10.1017/S1431927614003894

DO - 10.1017/S1431927614003894

M3 - Conference article

AN - SCOPUS:84927932543

SN - 1431-9276

VL - 20

SP - 434

EP - 435

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Revealing the origin of phonon glass-electron crystal behavior in thermoelectric layered cobaltate by accurate displacement measurement

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