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Round-Robin studies of two potential Seebeck coefficient standard reference materials

  • Nathan D. Lowhorn
  • , W. Wong-Ng
  • , W. Zhang
  • , Z. Q. Lu
  • , M. Otani
  • , E. Thomas
  • , M. Green
  • , T. N. Tran
  • , N. Dilley
  • , N. Eisner
  • , T. Hogan
  • , Q. Li
  • , H. Obara
  • , J. Sharp
  • , R. Venkatasubramanian
  • , R. Willigan
  • , J. Yang
  • , G. Nolas
  • , T. Tritt
  • National Institute of Standards and Technology
  • Naval Surface Warfare Center
  • Quantum Design
  • Hi-Z Technology, Inc.
  • Michigan State University
  • National Institute of Advanced Industrial Science and Technology
  • Marlow Industries, Inc.
  • RTI International
  • United Technologies
  • General Motors
  • University of South Florida
  • Clemson University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The scientific activities of NIST include the development and distribution of standard reference materials (SRM™) for instrument calibration and inter-laboratory data comparison. Full characterization of a thermoelectric material requires measurement of the electrical resistivity, thermal conductivity, and Seebeck coefficient. While standard reference materials exist or have existed for the first two properties, Seebeck coefficient standard reference materials are not available. In an effort to expedite research efforts in this field, we have initiated a project to develop a Seebeck coefficient SRM™ material. Currently, we have completed a round-robin measurement survey of two candidate materials, Bi2Te3 and constantan (55% Cu and 45% Ni). In this paper, we summarize our plan and development effort, including the results and the methodology used for the round-robin measurement survey.

Original languageEnglish
Title of host publicationProceedings ICT'07 - 26th International Conference on Thermoelectrics
Pages361-365
Number of pages5
DOIs
StatePublished - 2007
EventICT'07 - 26th International Conference on Thermoelectrics - Jeju, Korea, Republic of
Duration: Jun 3 2007Jun 7 2007

Publication series

NameInternational Conference on Thermoelectrics, ICT, Proceedings

Conference

ConferenceICT'07 - 26th International Conference on Thermoelectrics
Country/TerritoryKorea, Republic of
CityJeju
Period06/3/0706/7/07

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