Abstract
Computer modeling using the ray-tracing method has been used to simulate the grazing-incidence x-ray topographic images of micropipes in 4H silicon carbide recorded using the pyramidal (11-28) reflection. Simulation results indicate that the images of micropipes appear as white features of roughly elliptical shape, canted to one side or other of the g vector depending on the dislocation sense. Observed images compare well with the simulations, demonstrating that the direction of cant provides a simple, nondestructive, and reliable way to reveal the senses of micropipes. Sense assignment has been validated using back-reflection reticulography.
| Original language | English |
|---|---|
| Article number | 071917 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2007 |
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