TY - JOUR
T1 - SENSEI at SNOLAB
T2 - Single-Electron Event Rate and Implications for Dark Matter
AU - SENSEI Collaboration
AU - Bloch, Itay M.
AU - Botti, Ana M.
AU - Cababie, Mariano
AU - Cancelo, Gustavo
AU - Cervantes-Vergara, Brenda A.
AU - Daal, Miguel
AU - Desai, Ansh
AU - Drlica-Wagner, Alex
AU - Essig, Rouven
AU - Estrada, Juan
AU - Etzion, Erez
AU - Moroni, Guillermo Fernandez
AU - Holland, Stephen E.
AU - Kehat, Jonathan
AU - Lawson, Ian
AU - Luoma, Steffon
AU - Orly, Aviv
AU - Perez, Santiago E.
AU - Rodrigues, Dario
AU - Saffold, Nathan A.
AU - Scorza, Silvia
AU - Sofo-Haro, Miguel
AU - Stifter, Kelly
AU - Tiffenberg, Javier
AU - Uemura, Sho
AU - Villalpando, Edgar Marrufo
AU - Volansky, Tomer
AU - Winkel, Federico
AU - Wu, Yikai
AU - Yu, Tien Tien
N1 - Publisher Copyright:
© 2025 American Physical Society.
PY - 2025/4/25
Y1 - 2025/4/25
N2 - We present results from data acquired by the SENSEI experiment at SNOLAB after a major upgrade in May 2023, which includes deploying 16 new sensors and replacing the copper trays that house the CCDs with a new light-tight design. We observe a single-electron event rate of (1.39±0.11)×10-5 e-/pix/day, corresponding to (39.8±3.1) e-/gram/day. This is an order-of-magnitude improvement compared to the previous lowest single-electron rate in a silicon detector and the lowest for any photon detector in the wavelength range between near-infrared and ultraviolet. We use these data to obtain a 90% confidence level upper bound of 1.53×10-5 e-/pix/day and to set constraints on sub-GeV dark matter candidates that produce single-electron events. We hypothesize that the data taken at SNOLAB in the previous run, with an older tray design for the sensors, contained a larger rate of single-electron events due to light leaks. We test this hypothesis using data from the SENSEI detector located in the MINOS cavern at Fermilab.
AB - We present results from data acquired by the SENSEI experiment at SNOLAB after a major upgrade in May 2023, which includes deploying 16 new sensors and replacing the copper trays that house the CCDs with a new light-tight design. We observe a single-electron event rate of (1.39±0.11)×10-5 e-/pix/day, corresponding to (39.8±3.1) e-/gram/day. This is an order-of-magnitude improvement compared to the previous lowest single-electron rate in a silicon detector and the lowest for any photon detector in the wavelength range between near-infrared and ultraviolet. We use these data to obtain a 90% confidence level upper bound of 1.53×10-5 e-/pix/day and to set constraints on sub-GeV dark matter candidates that produce single-electron events. We hypothesize that the data taken at SNOLAB in the previous run, with an older tray design for the sensors, contained a larger rate of single-electron events due to light leaks. We test this hypothesis using data from the SENSEI detector located in the MINOS cavern at Fermilab.
UR - https://www.scopus.com/pages/publications/105003727400
U2 - 10.1103/PhysRevLett.134.161002
DO - 10.1103/PhysRevLett.134.161002
M3 - Article
C2 - 40344115
AN - SCOPUS:105003727400
SN - 0031-9007
VL - 134
JO - Physical Review Letters
JF - Physical Review Letters
IS - 16
M1 - 161002
ER -