TY - GEN
T1 - Severe Light, Textureless Sight
T2 - 33rd ACM International Conference on Multimedia, MM 2025
AU - Wang, Bo
AU - Liu, Jin
AU - Fu, Huiyuan
AU - Wang, Xin
AU - Zhang, Heng
AU - Ma, Huadong
N1 - Publisher Copyright:
© 2025 ACM.
PY - 2025/10/27
Y1 - 2025/10/27
N2 - Exposure correction aims to restore underexposed and overexposed images to normal exposed images in a single network. However, conventional methods primarily focus on correcting non-extreme exposure cases and struggle to accurately restore lightness and structure information in extreme exposure scenarios. Through a thorough investigation, we observe that the extreme exposure correction task is limited by the lack of high-quality benchmark datasets. To address the above challenges, in this paper, we construct the first Extreme Exposure Dataset named EED by manually collecting a large number of diverse scenes. By introducing probabilistic blur kernel, EED not only ensures the rich diversity and brightness distribution of scenes but also approaches the degradation of the real world. To achieve exposure correction in extreme conditions, we propose a novel Extreme Exposure Correction Network by leveraging the mask-aware Fourier transform prior, which decouples lightness and structure components precisely. To restore severe abnormal lightness and lost structure information in extreme exposure scenes, we introduce a well-exposed referenced image to guide the coarse restoration and employ a Timestep-guided Frequency Diffusion Module for further refinement. Extensive experiments demonstrate the superiority of our dataset and method. The dataset will be available at https://github.com/juvenoia/EED.
AB - Exposure correction aims to restore underexposed and overexposed images to normal exposed images in a single network. However, conventional methods primarily focus on correcting non-extreme exposure cases and struggle to accurately restore lightness and structure information in extreme exposure scenarios. Through a thorough investigation, we observe that the extreme exposure correction task is limited by the lack of high-quality benchmark datasets. To address the above challenges, in this paper, we construct the first Extreme Exposure Dataset named EED by manually collecting a large number of diverse scenes. By introducing probabilistic blur kernel, EED not only ensures the rich diversity and brightness distribution of scenes but also approaches the degradation of the real world. To achieve exposure correction in extreme conditions, we propose a novel Extreme Exposure Correction Network by leveraging the mask-aware Fourier transform prior, which decouples lightness and structure components precisely. To restore severe abnormal lightness and lost structure information in extreme exposure scenes, we introduce a well-exposed referenced image to guide the coarse restoration and employ a Timestep-guided Frequency Diffusion Module for further refinement. Extensive experiments demonstrate the superiority of our dataset and method. The dataset will be available at https://github.com/juvenoia/EED.
KW - dataset
KW - exposure correction
KW - fourier transform
UR - https://www.scopus.com/pages/publications/105024068859
U2 - 10.1145/3746027.3755353
DO - 10.1145/3746027.3755353
M3 - Conference contribution
AN - SCOPUS:105024068859
T3 - MM 2025 - Proceedings of the 33rd ACM International Conference on Multimedia, Co-Located with MM 2025
SP - 441
EP - 449
BT - MM 2025 - Proceedings of the 33rd ACM International Conference on Multimedia, Co-Located with MM 2025
PB - Association for Computing Machinery, Inc
Y2 - 27 October 2025 through 31 October 2025
ER -