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Severe Light, Textureless Sight: A Benchmark for Extreme Exposure Correction

  • Bo Wang
  • , Jin Liu
  • , Huiyuan Fu
  • , Xin Wang
  • , Heng Zhang
  • , Huadong Ma
  • Beijing University of Posts and Telecommunications
  • Xiaomi Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Exposure correction aims to restore underexposed and overexposed images to normal exposed images in a single network. However, conventional methods primarily focus on correcting non-extreme exposure cases and struggle to accurately restore lightness and structure information in extreme exposure scenarios. Through a thorough investigation, we observe that the extreme exposure correction task is limited by the lack of high-quality benchmark datasets. To address the above challenges, in this paper, we construct the first Extreme Exposure Dataset named EED by manually collecting a large number of diverse scenes. By introducing probabilistic blur kernel, EED not only ensures the rich diversity and brightness distribution of scenes but also approaches the degradation of the real world. To achieve exposure correction in extreme conditions, we propose a novel Extreme Exposure Correction Network by leveraging the mask-aware Fourier transform prior, which decouples lightness and structure components precisely. To restore severe abnormal lightness and lost structure information in extreme exposure scenes, we introduce a well-exposed referenced image to guide the coarse restoration and employ a Timestep-guided Frequency Diffusion Module for further refinement. Extensive experiments demonstrate the superiority of our dataset and method. The dataset will be available at https://github.com/juvenoia/EED.

Original languageEnglish
Title of host publicationMM 2025 - Proceedings of the 33rd ACM International Conference on Multimedia, Co-Located with MM 2025
PublisherAssociation for Computing Machinery, Inc
Pages441-449
Number of pages9
ISBN (Electronic)9798400720352
DOIs
StatePublished - Oct 27 2025
Event33rd ACM International Conference on Multimedia, MM 2025 - Dublin, Ireland
Duration: Oct 27 2025Oct 31 2025

Publication series

NameMM 2025 - Proceedings of the 33rd ACM International Conference on Multimedia, Co-Located with MM 2025

Conference

Conference33rd ACM International Conference on Multimedia, MM 2025
Country/TerritoryIreland
CityDublin
Period10/27/2510/31/25

Keywords

  • dataset
  • exposure correction
  • fourier transform

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