Shear modulation force microscopy study of near surface glass transition temperatures

S. Ge; Y. Pu; W. Zhang; M. Rafailovich; J. Sokolov; C. Buenviaje; R. Buckmaster; R. M. Overney

doi:10.1103/PhysRevLett.85.2340

Shear modulation force microscopy study of near surface glass transition temperatures

S. Ge
, Y. Pu
, W. Zhang
, M. Rafailovich
, J. Sokolov
, C. Buenviaje
, R. Buckmaster
, R. M. Overney

Materials Science and Engineering

Stony Brook University
University of Washington

Research output: Contribution to journal › Article › peer-review

287 Scopus citations

Abstract

The glass transition temperatures (T_g) of polymer thin films were measured using a new, highly sensitive atomic force microscopy (AFM) mode, shear modulation force microscopy (SMFM). Supported and freestanding samples were annealed in a vacuum of 10^-4 Torr at 170°C or 110°C for at least 4 h prior to performing the AFM experiments to anneal out residual orientation effects from the spinning procedure. It was found that the surface T_g of the films is independent of film thickness, strength interactions, or even presence of substrate.

Original language	English
Pages (from-to)	2340-2343
Number of pages	4
Journal	Physical Review Letters
Volume	85
Issue number	11
DOIs	https://doi.org/10.1103/PhysRevLett.85.2340
State	Published - Sep 11 2000

Access to Document

10.1103/PhysRevLett.85.2340

Cite this

@article{7619c080dd3149e29a3cbb0372025a79,

title = "Shear modulation force microscopy study of near surface glass transition temperatures",

abstract = "The glass transition temperatures (Tg) of polymer thin films were measured using a new, highly sensitive atomic force microscopy (AFM) mode, shear modulation force microscopy (SMFM). Supported and freestanding samples were annealed in a vacuum of 10-4 Torr at 170°C or 110°C for at least 4 h prior to performing the AFM experiments to anneal out residual orientation effects from the spinning procedure. It was found that the surface Tg of the films is independent of film thickness, strength interactions, or even presence of substrate.",

author = "S. Ge and Y. Pu and W. Zhang and M. Rafailovich and J. Sokolov and C. Buenviaje and R. Buckmaster and Overney, \{R. M.\}",

year = "2000",

month = sep,

day = "11",

doi = "10.1103/PhysRevLett.85.2340",

language = "English",

volume = "85",

pages = "2340--2343",

journal = "Physical Review Letters",

issn = "0031-9007",

number = "11",

}

TY - JOUR

T1 - Shear modulation force microscopy study of near surface glass transition temperatures

AU - Ge, S.

AU - Pu, Y.

AU - Zhang, W.

AU - Rafailovich, M.

AU - Sokolov, J.

AU - Buenviaje, C.

AU - Buckmaster, R.

AU - Overney, R. M.

PY - 2000/9/11

Y1 - 2000/9/11

N2 - The glass transition temperatures (Tg) of polymer thin films were measured using a new, highly sensitive atomic force microscopy (AFM) mode, shear modulation force microscopy (SMFM). Supported and freestanding samples were annealed in a vacuum of 10-4 Torr at 170°C or 110°C for at least 4 h prior to performing the AFM experiments to anneal out residual orientation effects from the spinning procedure. It was found that the surface Tg of the films is independent of film thickness, strength interactions, or even presence of substrate.

AB - The glass transition temperatures (Tg) of polymer thin films were measured using a new, highly sensitive atomic force microscopy (AFM) mode, shear modulation force microscopy (SMFM). Supported and freestanding samples were annealed in a vacuum of 10-4 Torr at 170°C or 110°C for at least 4 h prior to performing the AFM experiments to anneal out residual orientation effects from the spinning procedure. It was found that the surface Tg of the films is independent of film thickness, strength interactions, or even presence of substrate.

UR - https://www.scopus.com/pages/publications/0034274497

U2 - 10.1103/PhysRevLett.85.2340

DO - 10.1103/PhysRevLett.85.2340

M3 - Article

AN - SCOPUS:0034274497

SN - 0031-9007

VL - 85

SP - 2340

EP - 2343

JO - Physical Review Letters

JF - Physical Review Letters

IS - 11

ER -

Shear modulation force microscopy study of near surface glass transition temperatures

Abstract

Access to Document

Other files and links

Fingerprint

Cite this