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Short-term depression in VLSI stochastic synapse

  • University of Maryland, College Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We report a compact realization of short-term depression (STD) in a VLSI stochastic synapse. The behavior of the circuit is based on a subtractive single release model of STD. Experimental results agree well with simulation and exhibit expected STD behavior: the transmitted spike train has negative autocorrelation and lower power spectral density at low frequencies which can remove redundancy in the input spike train, and the mean transmission probability is inversely proportional to the input spike rate which has been suggested as an automatic gain control mechanism in neural systems. The dynamic stochastic synapse could potentially be a powerful addition to existing deterministic VLSI spiking neural systems.

Original languageEnglish
Title of host publicationAdvances in Neural Information Processing Systems 21 - Proceedings of the 2008 Conference
PublisherNeural Information Processing Systems
Pages1817-1824
Number of pages8
ISBN (Print)9781605609492
StatePublished - 2009
Event22nd Annual Conference on Neural Information Processing Systems, NIPS 2008 - Vancouver, BC, Canada
Duration: Dec 8 2008 → Dec 11 2008

Publication series

NameAdvances in Neural Information Processing Systems 21 - Proceedings of the 2008 Conference

Conference

Conference22nd Annual Conference on Neural Information Processing Systems, NIPS 2008
Country/TerritoryCanada
CityVancouver, BC
Period12/8/08 → 12/11/08

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