Abstract
We have designed and tested a Rapid Single-Flux- Quantum (RSFQ) circuit for experimental measurement of the fluctuation-induced threshold uncertainty of switching of SFQ comparators, which are the most essential single components of the RSFQ logic devices, analog-to-digital converters, and digital SQUIDs. Statistical density of the switching events in comparators using externally-overdamped Nb-trilayer Josephson junctions has been found to be in a nice agreement with the distribution which follows from a simple theory based on a time-dependent harmonic-oscillator model of the device. Width of the distribution (i.e., the single-shot current resolution of the comparator) measured as a function of temperature in the range 1.7-4.2 K corresponds to fundamental (thermal/quantum) fluctuations, with no evidence of excess noise sources.
| Original language | English |
|---|---|
| Pages (from-to) | 2240-2243 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 5 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jun 1995 |
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