Skip to main navigation Skip to search Skip to main content

Soft X-ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite

  • D. A. Fischer
  • , A. R. Moodenbaugh
  • , Qiang Li
  • , G. D. Gu
  • , Yimei Zhu
  • , J. W. Davenport
  • , D. O. Welch
  • , Haibin Su
  • National Institute of Standards and Technology
  • Brookhaven National Laboratory
  • Nanyang Technological University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Soft X-ray absorption spectroscopy (XAS), using fluorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.

Original languageEnglish
Pages (from-to)1207-1216
Number of pages10
JournalModern Physics Letters B
Volume20
Issue number19
DOIs
StatePublished - Aug 20 2006

Keywords

  • MgB
  • Soft X-ray absorption
  • Superconductor

Fingerprint

Dive into the research topics of 'Soft X-ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite'. Together they form a unique fingerprint.

Cite this