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Spatially Resolved Spectroscopy for Electron Beam Patterned Metal-Organic-Based Materials

  • Andrea Kraetz
  • , Yurun Miao
  • , Kayley E. Waltz
  • , Prerna Prerna
  • , Mueed Ahmad
  • , J. Anibal Boscoboinik
  • , J. Ilja Siepman
  • , Samuel Tenney
  • , Michael Tsapatsis
  • Johns Hopkins University
  • University of Minnesota Twin Cities
  • Brookhaven National Laboratory
  • Stony Brook University
  • Johns Hopkins University Applied Physics Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Spatially resolved spectroscopy was used to determine spectroscopic signatures of electron beam induced changes in a metal-organic framework called Zeolitic Imidazolate Framework (ZIF)-L. Investigation of the structural changes caused by e-beam treatment were then used to develop a process for pattern development. ZIF-L exhibits dual-tone behavior depending on the choice of solvent, producing both negative and positive tone patterns.

Original languageEnglish
Title of host publicationAdvances in Patterning Materials and Processes XLII
EditorsRyan Callahan, Anuja De Silva
PublisherSPIE
ISBN (Electronic)9781510686427
DOIs
StatePublished - 2025
EventAdvances in Patterning Materials and Processes XLII - San Jose, United States
Duration: Feb 24 2025Feb 27 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13428
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAdvances in Patterning Materials and Processes XLII
Country/TerritoryUnited States
CitySan Jose
Period02/24/2502/27/25

Keywords

  • Electron Beam Lithography
  • Metal Organic Frameworks
  • Metal Organic Resist
  • Nano-IR
  • Negative-Tone
  • Positive-Tone
  • Spectroscopy
  • Zeolitic Imidazolate Frameworks

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