TY - GEN
T1 - Spectroscopy with a novel silicon structure
AU - Nick, Dann
AU - Cinzia, Da Via
AU - Francisca, Munoz Sanchez
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/10/3
Y1 - 2016/10/3
N2 - Radiation-hard detectors are needed for the High-Luminosity upgrade for the ATLAS experiment at the Large Hadron Collider at CERN. 3D silicon devices are a technology which may be able to provide the required resolution and durability when exposed to ionising radiation. 3D sensors have electrodes processed inside the silicon bulk rather than being implanted on its surface. This paper will present a comparison of the performances of 3D and planar silicon sensors, both connected to pixel-based TimePix readout chips. The 3D detector was found to have less charge sharing and to operate at a lower bias voltage than the planar detector, due to the smaller electrode separation in the latter.
AB - Radiation-hard detectors are needed for the High-Luminosity upgrade for the ATLAS experiment at the Large Hadron Collider at CERN. 3D silicon devices are a technology which may be able to provide the required resolution and durability when exposed to ionising radiation. 3D sensors have electrodes processed inside the silicon bulk rather than being implanted on its surface. This paper will present a comparison of the performances of 3D and planar silicon sensors, both connected to pixel-based TimePix readout chips. The 3D detector was found to have less charge sharing and to operate at a lower bias voltage than the planar detector, due to the smaller electrode separation in the latter.
UR - https://www.scopus.com/pages/publications/84994131580
U2 - 10.1109/NSSMIC.2015.7581883
DO - 10.1109/NSSMIC.2015.7581883
M3 - Conference contribution
AN - SCOPUS:84994131580
T3 - 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
BT - 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
Y2 - 31 October 2015 through 7 November 2015
ER -