Strong tip effects in near-field scanning optical tomography

Jin Sun; P. Scott Carney; John C. Schotland

doi:10.1063/1.2812545

Strong tip effects in near-field scanning optical tomography

Jin Sun
, P. Scott Carney
, John C. Schotland

Mechanical Engineering

University of Illinois at Urbana-Champaign
University of Pennsylvania

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

Original language	English
Article number	103103
Journal	Journal of Applied Physics
Volume	102
Issue number	10
DOIs	https://doi.org/10.1063/1.2812545
State	Published - 2007

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abstract = "A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.",

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Strong tip effects in near-field scanning optical tomography

Abstract

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