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Structures of thin ionomer films in solvent mixtures

  • Stony Brook University
  • National Institute of Standards and Technology
  • Korea Advanced Institute of Science and Technology
  • Brookhaven National Laboratory
  • PPG Industries, Inc.
  • City University of New York
  • McGill University

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We have used neutron reflectivity to measure the concentration profiles of polystyrenesulfonated acid (PSSAx) films with three different degrees of sulfonation (x = 3.4%, 12.8%, and 27.0%) in water, CCl4, and a mixture of the two solvents. The data show that, except for the x = 3.4% films where CCl4 is a good solvent, the largest degree of swelling occurred in the mixed solvent. Contrast matching the water to the polymer layer enabled us to profile the CCl4 concentration. The results showed that CCl4 and water were mixed within the polymer film in a ratio of 1:2 and 1:4 for 12.8 mol % and 27.0 mol % PSSA, respectively. Self-consistent-field calculations indicated that the number of adsorbed sulfonated blocks scales linearly with the degree of sulfonation. Using the interaction parameters between the PS and SA blocks obtained by fitting to the data in pure solvents, excellent agreement is obtained for the profiles of the polymer and the solvent mixtures for all values of x.

Original languageEnglish
Pages (from-to)6675-6682
Number of pages8
JournalLangmuir
Volume17
Issue number21
DOIs
StatePublished - Oct 16 2001

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