TY - GEN
T1 - Studies of c-axis threading screw dislocations in hexagonal SiC
AU - Chen, Yi
AU - Zhang, Ning
AU - Huang, Xianrong
AU - Dhanaraj, Govindhan
AU - Sanchez, Edward
AU - Michael, F. MacMillan
AU - Dudley, Michael
PY - 2008
Y1 - 2008
N2 - In our study, closed-core threading screw dislocations (TSDs) and micropipes were studied using synchrotron x-ray topography of various geometries. The Burgers vector magnitude of TSDs can be quantitatively determined from their dimensions in back-reflection x-ray topography, based on ray-tracing simulation. This has been verified by the images of elementary TSDs. Dislocation senses of closed-core threading screw dislocations and micropipes can be revealed by grazing-incidence x-ray topography. The threading screw dislocations can be converted into Frank partial dislocations on the basal planes which has been confirmed by transmission synchrotron x-ray topography.
AB - In our study, closed-core threading screw dislocations (TSDs) and micropipes were studied using synchrotron x-ray topography of various geometries. The Burgers vector magnitude of TSDs can be quantitatively determined from their dimensions in back-reflection x-ray topography, based on ray-tracing simulation. This has been verified by the images of elementary TSDs. Dislocation senses of closed-core threading screw dislocations and micropipes can be revealed by grazing-incidence x-ray topography. The threading screw dislocations can be converted into Frank partial dislocations on the basal planes which has been confirmed by transmission synchrotron x-ray topography.
UR - https://www.scopus.com/pages/publications/55849131765
U2 - 10.1557/proc-1069-d02-03
DO - 10.1557/proc-1069-d02-03
M3 - Conference contribution
AN - SCOPUS:55849131765
SN - 9781605110394
T3 - Materials Research Society Symposium Proceedings
SP - 45
EP - 51
BT - Materials Research Society Symposium Proceedings - Silicon Carbide 2008 - Materials, Processing and Devices
PB - Materials Research Society
T2 - Silicon Carbide 2008 - Materials, Processing and Devices
Y2 - 25 March 2008 through 27 March 2008
ER -