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Studies of c-axis threading screw dislocations in hexagonal SiC

  • Yi Chen
  • , Ning Zhang
  • , Xianrong Huang
  • , Govindhan Dhanaraj
  • , Edward Sanchez
  • , F. MacMillan Michael
  • , Michael Dudley
  • Stony Brook University
  • Brookhaven National Laboratory
  • Dow Chemical

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

In our study, closed-core threading screw dislocations (TSDs) and micropipes were studied using synchrotron x-ray topography of various geometries. The Burgers vector magnitude of TSDs can be quantitatively determined from their dimensions in back-reflection x-ray topography, based on ray-tracing simulation. This has been verified by the images of elementary TSDs. Dislocation senses of closed-core threading screw dislocations and micropipes can be revealed by grazing-incidence x-ray topography. The threading screw dislocations can be converted into Frank partial dislocations on the basal planes which has been confirmed by transmission synchrotron x-ray topography.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings - Silicon Carbide 2008 - Materials, Processing and Devices
PublisherMaterials Research Society
Pages45-51
Number of pages7
ISBN (Print)9781605110394
DOIs
StatePublished - 2008
EventSilicon Carbide 2008 - Materials, Processing and Devices - San Francisco, CA, United States
Duration: Mar 25 2008Mar 27 2008

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1069
ISSN (Print)0272-9172

Conference

ConferenceSilicon Carbide 2008 - Materials, Processing and Devices
Country/TerritoryUnited States
CitySan Francisco, CA
Period03/25/0803/27/08

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