Abstract
The application of Synchrotron White Beam X-ray Topography (SWBXT) as a non-destructive diagnostic technique to the characterization of defect structures in large size InP single crystals was presented. Various kinds of defect configurations, including slip bands, micro-twin lamellae, growth striations, individual dislocations, and precipitates, were revealed. The relationship between defect formation and growth conditions was briefly discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 610-613 |
| Number of pages | 4 |
| Journal | Conference Proceedings - International Conference on Indium Phosphide and Related Materials |
| State | Published - 1996 |
| Event | Proceedings of the 1996 8th International Conference on Indium Phosphide and Related Materials - Schwabisch Gmund, Ger Duration: Apr 21 1996 → Apr 25 1996 |
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