Abstract
A substrate biasing methodology is introduced based on modifying standard cells by inserting dedicated sub-strate contacts in those cells behaving as aggressive digital noise generators. These contacts are connected to a dedicated ground network. The proposed approach reduces two primary noise injection mechanisms: ground coupling and source/drain junction coupling. Limitations of the Kelvin biasing scheme are removed while achieving more than a 60% (9 dB) reduction in substrate noise at the cost of a 12% increase in area.
| Original language | English |
|---|---|
| Article number | 4253366 |
| Pages (from-to) | 3227-3230 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| DOIs | |
| State | Published - 2007 |
| Event | 2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States Duration: May 27 2007 → May 30 2007 |
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