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Substrate noise reduction based on noise aware cell design

  • Emre Salman
  • , Eby G. Friedman
  • , Radu M. Secareanu
  • , Olin L. Hartin
  • University of Rochester
  • Freescale Semiconductor

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

A substrate biasing methodology is introduced based on modifying standard cells by inserting dedicated sub-strate contacts in those cells behaving as aggressive digital noise generators. These contacts are connected to a dedicated ground network. The proposed approach reduces two primary noise injection mechanisms: ground coupling and source/drain junction coupling. Limitations of the Kelvin biasing scheme are removed while achieving more than a 60% (9 dB) reduction in substrate noise at the cost of a 12% increase in area.

Original languageEnglish
Article number4253366
Pages (from-to)3227-3230
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
DOIs
StatePublished - 2007
Event2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States
Duration: May 27 2007May 30 2007

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