Abstract
Development of extended X-ray absorption fine-structure (EXAFS) spectroscopy started in the early 1970s when Stern, Sayers and Lytle recognized that fine structure in X-ray absorption coefficient is related to the details of the nearest atomic environment about the X-ray absorbing atom [1]. Three and a half decades later, EXAFS together with X-ray absorption near edge structure (XANES) evolved into a versatile and widely available characterization tool that provides complementary information to other advanced spectroscopic, scattering and microscopic techniques.
| Original language | English |
|---|---|
| Pages (from-to) | 2-4 |
| Number of pages | 3 |
| Journal | Synchrotron Radiation News |
| Volume | 22 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2009 |
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