SYSTEM-LEVEL FAULT DIAGNOSIS IN MALICIOUS ENVIRONMENTS.

Rajiv Gupta; I. V. Ramakrishnan

SYSTEM-LEVEL FAULT DIAGNOSIS IN MALICIOUS ENVIRONMENTS.

Rajiv Gupta
, I. V. Ramakrishnan

Computer Science

Stony Brook University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

The authors introduce a deterministic fault model that can uniformly handle both partial tests and a class of intermittent faults. Their model can also handle fault masking without using test invalidation. The class of diagnosable systems in the proposed model is characterized and the computational complexity of diagnosability is examined.

Original language	English
Title of host publication	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
Publisher	IEEE
Pages	184-189
Number of pages	6
ISBN (Print)	0818607785
State	Published - 1987

Publication series

Name	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)	0731-3071

Cite this

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title = "SYSTEM-LEVEL FAULT DIAGNOSIS IN MALICIOUS ENVIRONMENTS.",

abstract = "The authors introduce a deterministic fault model that can uniformly handle both partial tests and a class of intermittent faults. Their model can also handle fault masking without using test invalidation. The class of diagnosable systems in the proposed model is characterized and the computational complexity of diagnosability is examined.",

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M3 - Conference contribution

AN - SCOPUS:0023207652

SN - 0818607785

T3 - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

SP - 184

EP - 189

BT - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

PB - IEEE

ER -

SYSTEM-LEVEL FAULT DIAGNOSIS IN MALICIOUS ENVIRONMENTS.

Abstract

Publication series

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