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The α-reliable mean-excess regret model for stochastic facility location modeling

  • Bank of America
  • Northwestern University
  • University of California at Berkeley

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

In this paper, we study a strategic facility location problem under uncertainty. The uncertainty associated with future events is modeled by defining alternative future scenarios with probabilities. We present a new model called the α-reliable meanexcess model that minimizes the expected regret with respect to an endogenously selected subset of worst-case scenarios whose collective probability of occurrence is no more than 1-α. Our mean-excess risk measure is coherent and computationally efficient. Computational experiments also show that the α-reliable mean-excess criterion matches the α-reliable minimax criterion closely.

Original languageEnglish
Pages (from-to)617-626
Number of pages10
JournalNaval Research Logistics
Volume53
Issue number7
DOIs
StatePublished - Oct 2006

Keywords

  • Location model
  • p-median
  • Risk management
  • Scenario modeling
  • Stochastic

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