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The imaging plate system interfaced to the large-volume press at beamline X17B1 of the national synchrotron light source

  • Stony Brook University

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

7 Scopus citations

Abstract

A double imaging plate is interfaced to the Large Volume High Pressure Device (LVHPD) SAM-85 for the collection of in situ X ray powder diffraction data suitable for Rietveld analysis. The two-dimensional detector, combined with the uniform pressure and temperature environments of the LVHPD and the wide energy range available from a new Laue-Bragg monochromator at X17B1, results in high-quality diffraction data suitable for Rietveld refinements. A disk-type heater is used to minimize extrinsic diffraction peaks from the surrounding materials. Diffraction effects resulting from the boron-epoxy pressure transmitting medium are removed by subtraction. To demonstrate the quality of data obtained from the imaging-plate system, the cation distributions over the available sites in the crystal structures of NiAl2O4-spinel and (Ni,Mg)2SiO4-olivine have been refined from data collected at high pressures and temperatures. In both cases cation ordering is observed to increase with pressure.

Original languageEnglish
Title of host publicationProperties of Earth and Planetary Materials at High Pressure and Temperature, 1998
EditorsMurli H. Manghnani, Takehiko Yagi
PublisherBlackwell Publishing Ltd
Pages139-144
Number of pages6
ISBN (Electronic)9781118664421
ISBN (Print)9780875900834
DOIs
StatePublished - 1997

Publication series

NameGeophysical Monograph Series
Volume101
ISSN (Print)0065-8448
ISSN (Electronic)2328-8779

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