The penetrability of a thin metallic film inside the RF field

Yongxiang Zhao; Ilan Ben-Zvi; Xiangyun Chang; Triveni Rao; Wei Chen; Robert Di Nardo; Rolf Beuttenmuller

doi:10.1109/PAC.2005.1591368

The penetrability of a thin metallic film inside the RF field

Yongxiang Zhao
, Ilan Ben-Zvi
, Xiangyun Chang
, Triveni Rao
, Wei Chen
, Robert Di Nardo
, Rolf Beuttenmuller

Physics and Astronomy

Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Thin metallic film was widely applied in various areas. Especially, recently we are planning to apply it in a "Secondary emission enhanced photo-injector", in which a diamond cathode is coated with a metallic film on its back to serve as a current path. The thickness of the film is originally considered to be in the order of 10 nm, which is much less than the skin depth, by a factor of almost 200. One would think intuitively that the RF filed would penetrate such a thin film. However, we found it is not true. The film will block most of the field. This paper addresses theoretical analysis as well as the experimental results, and demonstrates that the penetrability of a thin film is very poor. Consequently, most of the RF current will flow on the thin film causing a serious heating problem.

Original language	English
Title of host publication	Proceedings of the Particle Accelerator Conference, PAC 2005
Pages	3073-3075
Number of pages	3
DOIs	https://doi.org/10.1109/PAC.2005.1591368
State	Published - 2005
Event	Particle Accelerator Conference, PAC 2005 - Knoxville, TN, United States Duration: May 16 2005 → May 20 2005

Publication series

Name	Proceedings of the IEEE Particle Accelerator Conference
Volume	2005

Conference

Conference	Particle Accelerator Conference, PAC 2005
Country/Territory	United States
City	Knoxville, TN
Period	05/16/05 → 05/20/05

Access to Document

10.1109/PAC.2005.1591368

Cite this

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title = "The penetrability of a thin metallic film inside the RF field",

abstract = "Thin metallic film was widely applied in various areas. Especially, recently we are planning to apply it in a {"}Secondary emission enhanced photo-injector{"}, in which a diamond cathode is coated with a metallic film on its back to serve as a current path. The thickness of the film is originally considered to be in the order of 10 nm, which is much less than the skin depth, by a factor of almost 200. One would think intuitively that the RF filed would penetrate such a thin film. However, we found it is not true. The film will block most of the field. This paper addresses theoretical analysis as well as the experimental results, and demonstrates that the penetrability of a thin film is very poor. Consequently, most of the RF current will flow on the thin film causing a serious heating problem.",

author = "Yongxiang Zhao and Ilan Ben-Zvi and Xiangyun Chang and Triveni Rao and Wei Chen and \{Di Nardo\}, Robert and Rolf Beuttenmuller",

year = "2005",

doi = "10.1109/PAC.2005.1591368",

language = "English",

isbn = "0780388593",

series = "Proceedings of the IEEE Particle Accelerator Conference",

pages = "3073--3075",

booktitle = "Proceedings of the Particle Accelerator Conference, PAC 2005",

note = "Particle Accelerator Conference, PAC 2005 ; Conference date: 16-05-2005 Through 20-05-2005",

}

Zhao, Y, Ben-Zvi, I, Chang, X, Rao, T, Chen, W, Di Nardo, R & Beuttenmuller, R 2005, The penetrability of a thin metallic film inside the RF field. in Proceedings of the Particle Accelerator Conference, PAC 2005., 1591368, Proceedings of the IEEE Particle Accelerator Conference, vol. 2005, pp. 3073-3075, Particle Accelerator Conference, PAC 2005, Knoxville, TN, United States, 05/16/05. https://doi.org/10.1109/PAC.2005.1591368

The penetrability of a thin metallic film inside the RF field. / Zhao, Yongxiang; Ben-Zvi, Ilan; Chang, Xiangyun et al.
Proceedings of the Particle Accelerator Conference, PAC 2005. 2005. p. 3073-3075 1591368 (Proceedings of the IEEE Particle Accelerator Conference; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The penetrability of a thin metallic film inside the RF field

AU - Zhao, Yongxiang

AU - Ben-Zvi, Ilan

AU - Chang, Xiangyun

AU - Rao, Triveni

AU - Chen, Wei

AU - Di Nardo, Robert

AU - Beuttenmuller, Rolf

PY - 2005

Y1 - 2005

N2 - Thin metallic film was widely applied in various areas. Especially, recently we are planning to apply it in a "Secondary emission enhanced photo-injector", in which a diamond cathode is coated with a metallic film on its back to serve as a current path. The thickness of the film is originally considered to be in the order of 10 nm, which is much less than the skin depth, by a factor of almost 200. One would think intuitively that the RF filed would penetrate such a thin film. However, we found it is not true. The film will block most of the field. This paper addresses theoretical analysis as well as the experimental results, and demonstrates that the penetrability of a thin film is very poor. Consequently, most of the RF current will flow on the thin film causing a serious heating problem.

AB - Thin metallic film was widely applied in various areas. Especially, recently we are planning to apply it in a "Secondary emission enhanced photo-injector", in which a diamond cathode is coated with a metallic film on its back to serve as a current path. The thickness of the film is originally considered to be in the order of 10 nm, which is much less than the skin depth, by a factor of almost 200. One would think intuitively that the RF filed would penetrate such a thin film. However, we found it is not true. The film will block most of the field. This paper addresses theoretical analysis as well as the experimental results, and demonstrates that the penetrability of a thin film is very poor. Consequently, most of the RF current will flow on the thin film causing a serious heating problem.

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DO - 10.1109/PAC.2005.1591368

M3 - Conference contribution

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SN - 0780388593

SN - 9780780388598

T3 - Proceedings of the IEEE Particle Accelerator Conference

SP - 3073

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BT - Proceedings of the Particle Accelerator Conference, PAC 2005

T2 - Particle Accelerator Conference, PAC 2005

Y2 - 16 May 2005 through 20 May 2005

ER -

The penetrability of a thin metallic film inside the RF field

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