Thermal expansion in UO2 determined by high-energy X-ray diffraction

M. Guthrie; C. J. Benmore; L. B. Skinner; O. L.G. Alderman; J. K.R. Weber; J. B. Parise; M. Williamson

doi:10.1016/j.jnucmat.2016.06.042

Thermal expansion in UO₂ determined by high-energy X-ray diffraction

M. Guthrie
, C. J. Benmore
, L. B. Skinner
, O. L.G. Alderman
, J. K.R. Weber
, J. B. Parise
, M. Williamson

Geosciences

European Spallation Source ERIC
Argonne National Laboratory
Stony Brook University
Materials Development Inc.

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO₂ up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.

Original language	English
Pages (from-to)	19-22
Number of pages	4
Journal	Journal of Nuclear Materials
Volume	479
DOIs	https://doi.org/10.1016/j.jnucmat.2016.06.042
State	Published - Oct 1 2016

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10.1016/j.jnucmat.2016.06.042

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abstract = "Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO2 up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.",

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AU - Guthrie, M.

AU - Benmore, C. J.

AU - Skinner, L. B.

AU - Alderman, O. L.G.

AU - Weber, J. K.R.

AU - Parise, J. B.

AU - Williamson, M.

PY - 2016/10/1

Y1 - 2016/10/1

N2 - Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO2 up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.

AB - Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO2 up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.

UR - https://www.scopus.com/pages/publications/84976870541

U2 - 10.1016/j.jnucmat.2016.06.042

DO - 10.1016/j.jnucmat.2016.06.042

M3 - Article

AN - SCOPUS:84976870541

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VL - 479

SP - 19

EP - 22

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

ER -

Thermal expansion in UO₂ determined by high-energy X-ray diffraction

Abstract

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