Abstract
We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.
| Original language | English |
|---|---|
| Pages (from-to) | 1072-1074 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 26 |
| Issue number | 14 |
| DOIs | |
| State | Published - Jul 15 2001 |
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