Abstract
A new method for determination of minority carrier lifetimes, mobilities and diffusion lengths is demonstrated. From the transient response of long wavelength infrared barrier detectors with a cut-off of 10 micron, the mobility of the minority holes and their lifetime in bulk InAs0.6Sb0.4 at T = 77 K was determined to be 800 cm2 V-1s-1 and 165 ns, respectively.
| Original language | English |
|---|---|
| Article number | 112002 |
| Journal | Semiconductor Science and Technology |
| Volume | 29 |
| Issue number | 11 |
| DOIs | |
| State | Published - Nov 1 2014 |
Keywords
- carrier lifetime
- InAsSb
- MBE
- metamorphic growth
- mobility
- photodetectors
- time response
Fingerprint
Dive into the research topics of 'Transport properties of holes in bulk InAsSb and performance of barrier long-wavelength infrared detectors'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver