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Transport properties of holes in bulk InAsSb and performance of barrier long-wavelength infrared detectors

  • Stony Brook University
  • Peter the Great St. Petersburg Polytechnic University

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

A new method for determination of minority carrier lifetimes, mobilities and diffusion lengths is demonstrated. From the transient response of long wavelength infrared barrier detectors with a cut-off of 10 micron, the mobility of the minority holes and their lifetime in bulk InAs0.6Sb0.4 at T = 77 K was determined to be 800 cm2 V-1s-1 and 165 ns, respectively.

Original languageEnglish
Article number112002
JournalSemiconductor Science and Technology
Volume29
Issue number11
DOIs
StatePublished - Nov 1 2014

Keywords

  • carrier lifetime
  • InAsSb
  • MBE
  • metamorphic growth
  • mobility
  • photodetectors
  • time response

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