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Ultra-fast laser-induced crystallization of amorphous silicon films (LPM 2001)

  • University of California at Berkeley

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

Ultra-short pulsed laser irradiation was used to crystallize an a-Si film with a laser fluence of 0.12 J/cm2. The crystallization process was observed by time-resolved pump-and-probe imaging in the range of 0.2 ps to 100 ns. Reflectivity data along with post-processed SEM pictures provide evidence for a non-thermal ultra-fast solid-phase transition. A crystallization sequence based on atomic self-diffusion is suggested.

Original languageEnglish
Pages (from-to)100-103
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4426
DOIs
StatePublished - 2002
EventSecond International Symposium on Laser Precision Microfabrication - Singapore, Singapore
Duration: May 16 2001May 18 2001

Keywords

  • Amorphous silicon
  • Crystallization
  • Femtosecond
  • Tin films
  • Ultra-fast laser

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