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Ultrafast internal conversion in ethylene. I. the excited state lifetime

  • H. Tao
  • , T. K. Allison
  • , T. W. Wright
  • , A. M. Stooke
  • , C. Khurmi
  • , J. Van Tilborg
  • , Y. Liu
  • , R. W. Falcone
  • , A. Belkacem
  • , T. J. Martinez
  • Stanford University
  • SLAC National Accelerator Laboratory
  • Lawrence Berkeley National Laboratory
  • University of California at Davis
  • University of California at Berkeley

Research output: Contribution to journalArticlepeer-review

136 Scopus citations

Abstract

Using a combined theoretical and experimental approach, we investigate the non-adiabatic dynamics of the prototypical ethylene (C2H4) molecule upon π → π* excitation. In this first part of a two part series, we focus on the lifetime of the excited electronic state. The femtosecond time-resolved photoelectron spectrum (TRPES) of ethylene is simulated based on our recent molecular dynamics simulation using the ab initio multiple spawning method with multi-state second order perturbation theory H. Tao, B. G. Levine, and T. J. Martinez, J. Phys. Chem. A 113, 13656 (2009)10.1021/jp9063565. We find excellent agreement between the TRPES calculation and the photoion signal observed in a pump-probe experiment using femtosecond vacuum ultraviolet (h 7.7 eV) pulses for both pump and probe. These results explain the apparent discrepancy over the excited state lifetime between theory and experiment that has existed for ten years, with experiments e.g., P. Farmanara, V. Stert, and W. Radloff, Chem. Phys. Lett. 288, 518 (1998)10.1016/S0009-2614(98)00312-1 and K. Kosma, S. A. Trushin, W. Fuss, and W. E. Schmid, J. Phys. Chem. A 112, 7514 (2008)10.1021/jp803548c reporting much shorter lifetimes than predicted by theory. Investigation of the TRPES indicates that the fast decay of the photoion yield originates from both energetic and electronic factors, with the energetic factor playing a larger role in shaping the signal.

Original languageEnglish
Article number244306
JournalJournal of Chemical Physics
Volume134
Issue number24
DOIs
StatePublished - Jun 28 2011

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